What are the differences between scanning and transmission electron microscopes?

A transmission electron microscopes (TEM) can magnify a sample up to one million times. The sample must be cut extremely thin. An electron beam is directed onto the sample to be magnified and some of the electrons pass through and form a magnified image of the specimen A scanning electron microscope (SEM) can magnify a sample up to 100,000 times.

A sharply focused electron beam moves over the sample to create a magnified image of the surface. Some electrons in the beam scatter off the sample and are collected and counted by an electronic device. Each scanned point on the sample corresponds to a pixel on a television monitor; the more electrons the counting device detects, the brighter the pixel on the monitor is.As the electron beam scans over the entire sample, a complete image is displayed on the monitor.

SEMs are particularly useful because they can produce three-dimensional images of the surface of objects A SEM scans the surface of the sample bit by bit while a TEM which looks at a sample all at once. The scanning transmission electron microscope (STEM) combines elements of an SEM and a TEM and can resolve single atoms in a sample.

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